At the 40th IEEE Photovoltaic Specialist Conference (PVSC) in Denver, QESST Scholar Jaewon Oh won the Best Student Paper Award for Topical Area 12 on Reliability of PV. Jaewon’s paper on potentially induced degradation (PID) measured the efficacy of system-level PID mitigation based on applying reverse voltage during nighttime to offset daytime module damage. Results show that near-full recovery of efficiency at high irradiance levels can be achieved; however, at low irradiance levels, the shunt resistance and the quantum efficiency at low wavelengths could not be recovered.